E05411 - SEMI E54.11 - Specification for Sensor/Actuator Network Specific Device Model for Endpoint Devices Revision:SEMI E54.11-0316 - Superseded The surface characterization tests to

The surface characterization tests to be performed are specified herein

The scope is limited to defining the key EQIPs and their linking to process program parameters

such as an optical filar

and mirrors

described by a third entity) is outside the scope of this Standard

E05411 - SEMI E54.11 - Specification for Sensor/Actuator Network Specific Device Model for Endpoint Devices Revision:SEMI E54.11-0316 - Superseded The surface characterization tests toNOTICE: This Document is no longer published with the SEMI E54 suite of Standards. It is published and sold separately. This Specification is part of a suite of Standards that specify the implementation of SEMI Standards for the Sensor Actuator Network. The specific purpose of this Specification is to describe a network independent application model comprised of device objects that are common to all endpoint devices (EPD) on a semiconductor equipment