MF156900 - SEMI MF1569 - Guide for Generation of Consensus Reference Materials for Semiconductor Technology Revision:SEMI MF1569-94 (Reapproved 1999) - Superseded Transmittance of FPD Color Filter

Transmittance of FPD Color Filter Assemblies

SEMI D20 — Terminology for FPD Mask Defect

The actual footprint may vary by equipment type

02 grade oxygen bulk supply gas

SEMI E33 — Specification for Semiconductor Manufacturing Facility Electromagnetic Compatibility

MF156900 - SEMI MF1569 - Guide for Generation of Consensus Reference Materials for Semiconductor Technology Revision:SEMI MF1569-94 (Reapproved 1999) - Superseded Transmittance of FPD Color FilterThis Guide covers the steps to be taken to generate a set of ConRefs for a specific property or family of related properties required in semiconductor technology. The procedure for generating the set of ConRefs is based on interlaboratory testing in accordance with ASTM E691. It is assumed for the purposes of this Guide that the test method evaluated by the interlaboratory study (ILS) is appropriate for determining the property values of the ConRef.